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Electrically alterable avalanche-injection-type MOS READ-ONLY memory with stacked-gate structure
Iizuka, H.
;
Masuoka, F.
;
Tai Sato
;
Ishikawa, M.
Abstract
Publication:
IEEE Transactions on Electron Devices
Pub Date:
April 1976
DOI:
10.1109/T-ED.1976.18415
Bibcode:
1976ITED...23..379I