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Bake induced charge gain in NOR flash cells
Fastow, R.
;
Ahmed, K.
;
Haddad, S.
;
Randolph, M.
;
Huster, C.
;
Hom, P.
Abstract
Publication:
IEEE Electron Device Letters
Pub Date:
April 2000
DOI:
10.1109/55.830976
Bibcode:
2000IEDL...21..184F